KEYENCE OP-88231 — Stage for 300 mm wafers

The VK-X Series 3D Laser Scanning Confocal Microscope is equipped with a white light source and a laser source. The dual light source allows for capturing of both high-resolution height data on the surface of targets, as well as full-color images.

Specifications:

• Тип: Optional parts
• Назначение: Stage for 300 mm wafers
• Статус: Активна