KEYENCE VK-X4100 — Measurement head

The VK-X4000 Series 3D Optical Profiling Microscope combines laser confocal, white light interferometry, and focus variation methods into a single metrology system, enabling highly accurate, non-contact measurements on nearly any material and surface geometry. Its newly-developed multi-point measurement function further streamlines the analysis process by automating measurements across multiple locations and samples—eliminating complex setup or programming while delivering greater usability, throughput, and repeatability.

Specifications:

• Тип: Head
• Назначение: Measurement head
• Статус: Активна